24V Handheld Micrometer Laser Diameter Device Lumps And Necks Measurement

Brand Name:Screate DALA
Certification:CE
Model Number:F2010-K
Minimum Order Quantity:Negotiable
Delivery Time:7 - 15 working Days
Payment Terms:T/T, etc.
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Verified Supplier
Location: Chengdu China
Address: B2-2, No.8 of Electronic Science Park, Wulian 1st Road, Shuangliu District, Chengdu,China
Supplier`s last login times: within 33 hours
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Product Details

Technology of Simple Structure, Long Durability


F2010-k adopts laser diffraction measurement method, known for its simple structure and high accuracy.There is no motor, allowing for easy maintenance.
With a measurement repeatability of ±0.1um, F2010-k is applicable to various materials such as electric wire & cable, steel wire, enamelled copper wire, 3D filament etc.


Extremely short exposure time of 0.5us

Featuring an incredibly short exposure time, F2010-k excels at capturing object images without any blur or shadow, ensuring precise measurement accuracy.



Applications



Touch Screen,Computer,Cellphone

DALA F2010-K can be managed by computer ,cellphone and Touch screen,like parameter setting ,measurement data management ,

and so on,customers can choose as their application request.

Technical Specification


ModelF2010-K
Axis2-axis
Measurement datadiameter, ovality, lump and necks
Frequency10KHz/axis
Measurement range0.2~10mm
Repeatability(1)±0.1μm
Accuracy(2)±(0.0005+0.01%*D)mm
Min defect height0.01mm
Min defect length(3)0.2mm(wire speed120m/min)
0.8mm(wire speed500m/min)
Size155*140*58mm
Working power source24V ±10% 40VA
Running temperature5℃~50℃
DisplayLED display
Commuincation port

Standard:WIFI,RS485 MODBUS RTU,CAN

Option:PROFIBUS,PROFINET, EtherNet/IP,EtherCAT

Data colletion & analysisavailable (option DS14 ZT display and control system,DMS1000)
Out-of-tolerance alarmavailable
Transparent modeavailable

Note:

(1) set sliding window as 100ms, outside diameter repeatability of φ1mm round rod at measurement center area

(2) set sliding window as 100ms, outside diameter deviation of φ1mm round rod at measurement area

(3)set defect measurement average time as 0ms, the minimum defect length which cannot be missed at the measurable area

(4)PI feedback control is option, but must order at placing order


China 24V Handheld Micrometer Laser Diameter Device Lumps And Necks Measurement supplier

24V Handheld Micrometer Laser Diameter Device Lumps And Necks Measurement

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