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Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery

Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery

Brand Name:DGBELL
Certification:ISO-9001:2015
Model Number:BTG-072 / BTG-125 / BTG-270 / BTG-600 / BTG-1000
Minimum Order Quantity:1
Payment Terms:L/C, D/A, D/P, T/T
Place of Origin:China
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Location: Dongguan Guangdong China
Address: No.11 Wusong 1st Street, Dongcheng District, Dongguan 523117, Guangdong, China
Supplier`s last login times: within 1 hours
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Product Details

Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery


Applications


DGBELL's burn-in chamber is widely applied to electronic and electric products, components and materials by constant high low temperature, temperature shock and rapid temperature change reliability test.


Features


With high precision perfect external design, external with double sides cold rolled plate electrostatic powder coated material, internal with SUS#304 high temperature resistant stainless steel. Insulation material adopts fire resistant high strength glass fiber thermal insulating material. The Control system and control circuit all introduced with the famous brand.


Performance parameters


Temp. Range


Rt-250℃ (Optional for 500℃)

Temp. Fluctuation


≤±0.5

Temp. Deviation


≤±1.5℃

Temp. Uniformity


≤±1℃


Controller(Korea TEMI 300 programmable controller)


Display


TFT LCD

Input


Compatible for wet-dry bulbs PT100(T/C,RTD,DCV)

Accuracy


0.01% high precision sampling

System Capacity


10 programs, 100 segments for each program

Operating Mode


Fixed value/ Programmable running mode

Output Method


PID+SSR/SCR automatic bidirectional synchronous output

Start pre-set


Equipment starting can be pre-set.

Communication Interface


compatible for protocols (RS485, Modbus, etc.)


China Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery supplier

Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery

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