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8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

Brand Name:Phidix
Certification:IATF16949,CE
Model Number:M22003
Minimum Order Quantity:Negotiable
Delivery Time:40 Work Days
Payment Terms:L/C, D/A, D/P, T/T, Western Union
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Location: Shanghai Shanghai China
Address: Building #21, Block 9299, Tingwei Road, Jinshan District, Shanghai 201505(Headquarter and Sales Office: Shanghai Phidix Trading Co., Ltd.)
Supplier`s last login times: within 1 hours
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Product Details

Magnification 8X-300,000X Scanning Electron Microscope 3-6nm Resolution with Optional EBSD EBSD


M22003 electron microscope operating software can be switched in Chinese/English with modular layout. In addition to the basic operation function of electron microscope, it also has one-click image viewing. This series software supports simultaneous display of three real-time images, two channels with CCD window, and powerful auxiliary functions such as synthesis of secondary electron image and backscattered image, multi-point size measurement, text annotation of electron microscope pictures, vacuum map display, CCD window display, etc., to meet the individual needs of different users.


Automatic functions: focusing, brightness/contrast adjustment, astigmatism, electron beam centering, automatic correction of electron gun, fault detection, one-button viewing, optional 3D reconstruction, etc.

Saved pictures: 4096x4096pixel BMP, GIF, TIF, JPG, MNG, ICO SEM.


Specials:


- Magnification Max 300,000X.

- Signal Detection: CCD High Vacuum Secondary Electron Detector( With detector perotection function) , Semiconductor Four Segemation Back Scattering Electron Detector, CCD Montioring Camera.

- Accelerating Voltage: 0~30KV, High image resolution.

- EDS/EBSD/CL is optional, for component analysis.

- High Vacuum System.

- Four Axes Motorized Stage.


ItemSpecificationM22003AM22003B
Resolution3nm@30kV(SE)
6nm@30kV(BSE)
Magnification8X~300,000X, Displayed Magnification:Magnification is defined with a display size 127mm*211mm
Accelerating Voltage0~30kV

Signal Detection


CCD High Vacuum Secondary Electron Detector( With detector perotection function)

Semiconductor Four Segemation Back Scattering Electron Detector

CCD Montioring Camera

Electron GunTungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge/LaB6(Option)
Auto FunctionGun Heating,Bias,Centering,Focus,Bright,Contrast,Stigmator, Autocorrection,Fault Detection
StageSystem/MovementFour Axes Motorized Stage
X: 0~70mm, Auto
Y: 0~50mm, Auto
Z: 0~45mm, Auto
R: 360°, Auto
T: -5°~90°, Manual
Max Sample Diameter175mm
Max Sample Height35mm
Vacuum system1 TMP,1RP (Turbomolecular pump, mechanical pump)
Low vacuum atmosphere (10-270Pa)
Optional DetectorEDSEBSDCL
Optional AccessoriesEBLCryo&Heating StageNano ManipulatorTensile Stage

Note: ● means standard, ○ means optional


Gallery



Image Processing Software





China 8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD supplier

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

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