Semiconductor Parameter Analyzer Dual CPU Max Voltage 40V LCR 0.56ms 10 Bins
Application:Semiconductor
Data Analysis:Real-time Analysis
Data Storage:Internal Memory
Data Transfer:USB/Ethernet
Dimensions:Compact
Display:LCD Display
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Product Details
TH511 Semiconductor CV Analyzer: Dual CPU, Max.Voltage ±40V, LCR 0.56ms, 10 Bins
Application in Testing and Characterization: The DC Bias Current Source finds extensive use in testing and characterization of electronic components, such as transistors, diodes, integrated circuits (ICs), and sensors. It enables the assessment of device behavior under specific biasing conditions, facilitating the measurement of parameters like gain, linearity, leakage current, and threshold voltage. Additionally, it is employed in the calibration of measurement equipment, ensuring accurate and traceable results.
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Features
10.1-inch capacitive touch screen, resolution 1280*800, Linux system
Dual CPU architecture, the fastest test speed of LCR function is 0.56ms
Three test methods: spot test, list scan, and graphic scan (option)
Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen
CV curve scan, Ciss-Rg curve scan
Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC
Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel can be expanded to 6, channel parameters are stored separately
Fast charging, shortens capacitor charging time and enables fast testing
Automatic delay setting
High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V/3000V
10 bin sorting
Applications
Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.
Semiconductor material
Wafer, C-V characteristic analysis
Liquid crystal material
Elastic constant analysis
Capacitive element
Capacitor C-V characteristic test and analysis, capacitive sensor test and analysis
Specifications
| Model | TH511 | TH512 | TH513 | ||||
| Channel | 2 (4/6 Ch Optional) | 2 | |||||
| Display | Display | 10.1-inch capacitive touchscreen | |||||
| Ratio | 0.672916667 | ||||||
| Resolution | 1280*RGB*800 | ||||||
| Test Parameter | Ciss, Coss, Crss, Rg. Four parameter selectable arbitrarily | ||||||
| Test Frequency | Range | 1kHz-2MHz | |||||
| Accuracy | 0.0001 | ||||||
| Resolution | 10mHz1.00000kHz-9.99999kHz | ||||||
| 100mHz10.0000kHz-99.9999kHz | |||||||
| 1Hz100.000kHz-999.999kHz | |||||||
| 10Hz1.00000MHz-2.00000MHz | |||||||
| Test Level | Voltage Range | 5mVrms-2Vrms | |||||
| Accuracy | ± (10%*Setting Value+2mV) | ||||||
| Resolution | 1mVrms5mVrms-1Vrms | ||||||
| 10mVrms1Vrms-2Vrms | |||||||
| Vgs | Range | 0 - ±40V | |||||
| Accuracy | 1%* Setting Voltage+8mV | ||||||
| Resolution | 1mV0V - ±10V | ||||||
| 10mV10V - ±40V | |||||||
| Vds | Range | 0 - 200V | 0 - 1500V | 0 - 3000V | |||
| Accuracy | 1%* Setting Voltage+100mV | ||||||
| Output Impedance | 100, ±2%@1kHz | ||||||
| Computation | Absolute deviation from nominal value, percent deviation from nominal value % | ||||||
| Calibration Function | OPEN, SHORT, LOAD | ||||||
| Measure Average | 1-255 times | ||||||
| AD Conversion Time (ms/time) | Fast+: 0.56ms (＞5kHz), Fast: 3.3ms, Middle: 90ms, Slow: 220ms. | ||||||
| Basic Accuracy | 0.001 | ||||||
Semiconductor Parameter Analyzer Dual CPU Max Voltage 40V LCR 0.56ms 10 Bins
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