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Test Equipment Direct Power Supply Automatic ATE Comprehensive Test Equipment, with Fast Testing Speed and High Efficiency
Advantages:
• An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.
• An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.
• The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.
• The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)
• Complies with ENERGY STAR and IEC 62301 measurement requirements.
• Supports Manufacturing Information System (ShopFloor) interface.
• The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.
• Optimizes display mode, allowing for any combination of hardware configurations.
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity. (The testing speed for LED power supplies/adapters/chargers is more than double that of the widely used 6000 series power automatic systems.)
• Conducts parallel barcode scanning during testing, greatly improving testing speed.
Top-Smart 2000 ATE Power Supply Testing System Test Items:
Test items | Comprehensive Test items |
CEC test | Short circuit test |
DC Current under C.V.Mode | Short circuit current |
Peak-Peak noise | OV protection |
Serial reaction time test | UV protection |
Transient response time | OL protection |
Transient spike | OP protection |
Tracking | In-test adjustment test |
Voltage regulation | AC cycle drop out |
Current regulation | PLD simulation |
Turn ON time | DC output current test |
Rise time | DC output voltage test |
Fall time | Waveform read test |
Hold-up time | Input impulse current test |
Inrush current test | Input power |
Power good signal | Relay control |
Power fail signal | Bar code scan |
P/S ON signal | Dynamic test |
Power up sequence | Specification under C.P.Mode |
Power off sequence | Input Peak current |
Effciency test | Additional expansion measurement test |
Overall stability test | Input RMS current |
Fan Speed test | TTL signal control |
Input power factor | LAN read/write |
Input voltage ramp | RS485 read/write |
Input freq. ramp | USB read/write |
Extend the measurement test | 232 read/write |
Automatic test | GPIB read/write |