CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

Brand Name:Neide
Certification:CE
Model Number:ND-150
Minimum Order Quantity:1 set
Delivery Time:7-22 work days
Payment Terms:L/C,D/A,D/P,T/T,Western Union,MoneyGram
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Location: Dongguan Guangdong China
Address: No. 13, Shihuan Road, Dongcheng Sub-district, Dongguan City, Guangdong Province
Supplier`s last login times: within 21 hours
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CE Certified Thermal Shock Chamber For Semiconductor Testing


Production Description:

The Thermal Shock Test Chamber represents a state - of - the - art testing instrument engineered to assess the robustness of material structures and composite materials subjected to rapid and consecutive transitions between elevated - temperature and cryogenic - temperature environments. This chamber facilitates the evaluation of materials within the most expedient time frame, ascertaining the magnitude of thermal expansion and contraction, along with any concomitant chemical alterations or physical impairments.

Specification:

Model

ND-42

(A~C)

ND-60

(A~C)

ND-80

(A~C)

ND-100

(A~C)

ND-120

(A~C)

ND-150

(A~C)
Inner size: WHD(cm)40*30*3550*30*4050*40*4050*50*4060*40*5060*50*50
External size: WHD(cm)150*180*150160*175*160160*185*160160*185*170170*185*170170*195*170
Temperature range(Test Chamber)high temperature:+60℃~+200℃;low temperature -10℃~-65℃(A:-45℃;B:-55℃;C:-65℃)
Heating TimeRT~200℃ About 30min
Cooling TimeRT~-70℃ About 85min
Temperature Conversion Time
China CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test supplier

CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

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