Pharma Vial AI Defect Detector with Submicron OCT
Brand Name:KEYE
Certification:ISO/CE
Model Number:KY-P-C
Minimum Order Quantity:1 SET
Delivery Time:6 To 8 Weeks
Payment Terms:T/T Or F/C
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Verified Supplier
Location:
Hefei Anhui China
Address:
No. 56, Chang'an Rd, Hefei City, Anhui Province, China
Supplier`s last login times:
within 30 hours
Product Details
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Product Details
Technical Focus:
- Ultra-high-resolution OCT (1.3μm axial resolution):
- Detects micro-cracks in glass necks (≥2μm depth)
- Measures inner surface roughness (Ra ≤0.4μm)
- Vacuum decay testing integrated with vision (10 Pa resolution)
- Deep learning particle counter for visible contaminants (≥5μm)
Compliance: USP <790>, FDA CFR 211.84
Pharma Vial AI Defect Detector with Submicron OCT
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