250 Nm Kerr Microscope High Resolution Magneto Optical Kerr Effect Microscope
Brand Name:Truth Instruments
Payment Terms:T/T
Price:Price Negotiable | Contact us for a detailed quote
Place of Origin:CHINA
Name:Kerr Microscope
Electrical Source Meter:Keithley 6221,Keithley 2182A
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Qingdao Shandong China
Address:
169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China
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Product Details
Multifunctional Spin-Test Magneto-Optic Kerr Microscope
Product Model:
KMPL-S
Equipment Description:
This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and variable temperature modules. With a single button operation, it can observe magnetic dynamics under various excitation conditions, such as magnetic fields, currents, spin-orbit torque, and spin-transfer torque. It features microsecond-level fast-response magnetic fields for high-precision magnetic domain velocity and DMI measurements.
Equipment Performance
| Optical Resolution: | 250 nm |
| Objectives: | 5x,20x,50x,100x,non-magnetic |
| In-Plane Magnetic Field: | 1 T@air gap 5 mm; 0.5 T@air gap 10 mm; 0.3 T@air gap 16 mm |
| Vertical Magnetic Field: | 0.25 T@single pole |
| Magnetic Field Resolution | PID closed-loop feedback regulation, resolution 0.05 mT |
| Microsecond Ultrafast Pulse Vertical Magnetic Field | 60 mT, rise time 0.5μs, pulse width l μs - 10 μs |
| Probe Station | Compatible with 4-8 sets of non-magnetic probe holder |
| Elctrical Source Meter | Keithley 6221, Keithley 2182A |
| Testing Functions | Magnetic domain dynamic observation, global/micro-region hysteresis loop mapping based on Kerrsignals, domain wall velocity measurement, DMl measurement, anomalous Hall resistance, SOT switching, I-R hysteresis loop scanning with synchronized Kerr imaging, and curve mapping of Hallresistance changes in electronic devices under magnetic and current variations, along with corresponding Kerrimages |
Magnetic Domain Distribution in Thin Films
MgO(substrate)/Co/PtSample**: Magnetic defects caused by lattice mismatch between MgO crystal substrate and Co.
Poor-Quality Magnetic Films**:Snowflake-like magnetic domains during magneti creversal.
High-Quality Magnetic Films**Uniform magnetic domain structures with smooth edges.
Characterization of local magnetic intrinsic parameters
250 Nm Kerr Microscope High Resolution Magneto Optical Kerr Effect Microscope
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