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Glass Substrate Surface Defect Detection Equipment 1.8um

Glass Substrate Surface Defect Detection Equipment 1.8um

Brand Name:ZEIT
Certification:Case by case
Model Number:SDD-GS-X—X
Minimum Order Quantity:1set
Delivery Time:Case by case
Payment Terms:T/T
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Location: Chengdu Sichuan China
Address: CSCES strait screen and core intelligent manufacturing base,Shuangliu District,Chengdu City, Sichuan Province, P. R. China
Supplier`s last login times: within 21 hours
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Product Details

Glass Substrate Surface defect detector


Applications

For the process control and yield management of glass substrate manufacturing, we can help manufacturers to

identify and monitor the mask defects, reduce the risk of yield and improve their independent ability of R&D for

core technologies.


Working Principle

Using specific angle ring light, coaxial light source and running mechanism to collect and analyze the directional

photography information, thus realizing automatica detection for the defects on the glass substrate surface.


Features

ModelSDD-GS-X—X

Performance detection

Detectable defect typeScratches, Dusts
Detectable defect size1μm
Detection accuracy (measured)

100% detection of defects / collection of

defects (scratches, dust)

Detection efficiency

≤10 minutes

( Measured value : 350mm x 300mm Mask)

Optical System Performance

Resolution1.8μm
Magnification40x
Field of view0.5mm x 0.5mm
Blue light illumination460nm, 2.5w

Motion Platform Performance


X, Y two-axis motion

Marble countertop flatness: 2.5μm

Y-axis Z-direction runout precision: ≤ 10.5μm

Y-axis Z-direction runout precision: ≤8.5μm

Note: Customized production available.

Detection Images


Our Advantages

We are manufacturer.

Mature process.

Reply within 24 working hours.


Our ISO Certification


Parts Of Our Patents


Parts Of Our Awards and Qualifications of R&D


China Glass Substrate Surface Defect Detection Equipment 1.8um supplier

Glass Substrate Surface Defect Detection Equipment 1.8um

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