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Semiconductor Surface Detector Systems Optical Testing Equipment 40x

Semiconductor Surface Detector Systems Optical Testing Equipment 40x

Brand Name:ZEIT
Certification:Case by case
Model Number:SDD0.5-0.5
Minimum Order Quantity:1set
Delivery Time:Case by case
Payment Terms:T/T
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Location: Chengdu Sichuan China
Address: CSCES strait screen and core intelligent manufacturing base,Shuangliu District,Chengdu City, Sichuan Province, P. R. China
Supplier`s last login times: within 21 hours
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Product Details Company Profile
Product Details

Semiconductor Surface Detector Systems Optical Testing Equipment 40x


Applications

For the process control and yield management of blank mask in the fields of semiconductor display and

integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and

accurate automatic detection for the surface defects of blank mask. According to professional user needs,

we have developed series of high throughput MASK inspection machines with reliable quality and high cost

performance ratio, to help glass substrate, mask and panel manufacturers to identify and monitor the mask

defects, reduce the risk of yield and improve their independent ability of R&D for core technologies.


Working Principle

With regards to level and type of surface defect, 4x telecentric lens, specific angle ring light and coaxial light

source are selected as the visual approach. When the device is running, the sample moves along the X

direction and the vision module carries out defect detection along the Y direction.


Features

ModelSDD0.5-0.5

Performance detection

Detectable defect typeScratches, Dusts
Detectable defect size1μm

Detection accuracy

(measured)

100% detection of defects / collection of

defects (scratches, dust)

Detection efficiency

≤10 minutes

( Measured value : 350mm x 300mm Mask)

Optical System Performance

Resolution1.8μm
Magnification40x
Visual field0.5mm x 0.5mm
Blue light illumination460nm,2.5w

Motion Platform Performance



X, Y two-axis motion

Marble countertop flatness: 2.5μm

Y-axis Z-direction runout precision: ≤ 10.5μm

Y-axis Z-direction runout precision: ≤8.5μm


Note: Customized production available.

Detection Images


Our Advantages

We are manufacturer.

Mature process.

Reply within 24 working hours.


Our ISO Certification


Parts Of Our Patents


Parts Of Our Awards and Qualifications of R&D


ZEIT Group, founded in 2018, is a company focused on precision optics, semiconductor materials and high-tech intelligence equipments. Based on our advantages in precision machining of core and screen, optical detection and coating, ZEIT Group has been providing our customers with complete packages of customized and standardized product solutions.


Concentrated on technological innovations, ZEIT Group has more than 60 domestic patents by 2022 and established very close enterprise-college-research cooperations with institutes, universities and industrial association worldwide. Through innovations, self-owned intellectual properties and building up the key process experimental teams, ZEIT Group has become a development base for incubating high-tech products and a training base for high-end personnels.


China Semiconductor Surface Detector Systems Optical Testing Equipment 40x supplier

Semiconductor Surface Detector Systems Optical Testing Equipment 40x

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