Optical Vickers Micro Digital Hardness Tester High Internal Memory Capability

Brand Name:UNIMETRO
Model Number:HV-30Z
Minimum Order Quantity:1
Delivery Time:8 work days
Payment Terms:T/T
Place of Origin:China
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Location: Dongguan Guangdong China
Address: NO.4 Gangtou Hengcheng Road, Xin'an community, Chang'an Town, Dongguan City, China
Supplier`s last login times: within 22 hours
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Product Details

Duo Optical system Vickers Micro Hardness Tester Auto Turret Internal Memory


Features


Internal memory is included, all the specification can be saved after switching off. The data base is up to 6 groups, each group 20 records. Users are able to save the testing records in the memory and load as required.


Optical duo terminal system, users do not need to switch but are able to observe and measure via the eyepiece and the monitor at the same tine during automatic measuring process of the indentation.


Large LCD included, offers manual selecting function, makes the operation more easy and convenient.


Wide Application range: Black metal, nonferrous metal IC thin pieces, surface coating, laminated metal.

Glass, ceramics, agate, jewels, thin plastic, Hardness test for the depth and gradient of the charring layer and hardening layer


Specification


Testing force: 4.90,9.80,19.6,29.4,49.0,98.0,294.0)N

(0.5,1,2,3,5,10,30)Kgf

Carriage control: Full-automatic (loading / holding-up of loading / unloading)

Magnification of the measuring microscope: 100X, 200X

Holding time: (0~60)S

Min. graduation value of the test drum wheel: 0.25μm,0.125μm;

Testing range: (5~3999)HV

Max. Height of the specimen: 200 mm

Max. Width of the specimen: 130 mm

Power supply: 110V/220V/, 60/50Hz

Dimension: (550×210×580)mm

Weight: 35 Kg


Accessories


Vickers indenter

10X eyepiece

Working stage

V type working stage

Gradienter

Level adjusting screw

Vickers hardness block

RS232 communication cable

China Optical Vickers Micro Digital Hardness Tester High Internal Memory Capability supplier

Optical Vickers Micro Digital Hardness Tester High Internal Memory Capability

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