100~1000pF Capacitive Coupling Clamp Emc Testing Services For EFT/B Testing IEC61000-4-4

100~1000pF Capacitive Coupling Clamp for EFT/B Testing ( IEC61000-4-4)

1. Introduction

The capacitive coupling clamp is designed to work with electrical fast transient/ burst generator (EFT/B), The coupling method using the clamp is used for tests on lines connected to signal port, control port and power port. The performance of clamp is fully compliant with IEC61000-4-4.

2. Specification

3. Figure

Pego Electronics is founded by PEGO GROUP in 2011, a professional high-tech enterprise engaged in developing, marketing and service for electronic test equipment. Our business scope includes IEC60061-3 gauges for lamp caps and holders,UL498/VDE0620/BS1363-1 gauges for plug and socket, IEC61032 IP code probes, UL probes, flame test apparatus, glow-wire test apparatus, tracking index apparatus, needle flame test apparatus, ground resistance tester, insulating resistance tester, hipot tester, temperature chamber, waterproof test equipment, dust chamber, spring hammer, pendulum hammer, tumbling barrel test equipment, test vessels, ESD gun, surge generator, goniophotometer, integrating sphere, spectroradiometer, power supply and etc. Besides, we can provide customized service.

Nowadays, we have several production lines in China, we imported advance technology and machines to make the gauges to keep high precision, and use the world famous-brand components to make the equipment more reliable. We promise the customers can get the high quality products during the shortest lead time, and we can provide the third-lab calibration certificates if customer request. The Pego’s products have been sold to the world wide, and widely used in labs, production line, QC and R&D departments with the features of high precision, simple operation, humanization design and good performance.

To Provide better user experience with better quality and better price is the motto of Pego. With the growth of test items, PEGO hope to grow with our users, and search for better test solution for our users.