HXRF-450S XRF Coating Thickness Tester with SDD Detector

HXRF-450S XRF X-ray Fluorescence Coating Painting Thickness Tester

1. Introduction of model indicators:

1.1. Working Conditions:

● operating temperature: 15-30℃

● Relative humidity: 40%~50%

● power supply: AC: 220V ± 5V

1.2. Technical performance and indicators:

First, stability: HXRF-450S has good long-term stability, there is no need to calibrate the instrument frequently

Second, no need to prepare samples: whether for the coating system or for solid and liquid samples, the instrument can be measured and analyzed without a standard plate

Third, comprehensive performance: coating analysis qualitative analysis quantitative analysis bath analysis statistical function

1.3. Main application

Can be used for electronic components, semiconductors, PCB, FPC, LED bracket, auto parts, functional plating, decorative parts, connectors, terminals, sanitary ware, jewelry and other industries surface coating thickness measurement and material analysis, low cost, high efficiency

1.4 System safe

1 Simple user interface sets limited authorization to daily operators

2 Supervisors can maintain the system

3 The system automatically generates the operator's usage record

4 Automatic locking prevents unauthorized operations

5 Sample chamber door opening and closing sensor

6 X-ray warning light

7 Front panel security buttons

1.5 Working features

1. Measure 5 layers (4 layers of coating + substrate layer) of coating, analyze 15 elements at the same time, and automatically correct X-ray overlapping spectral lines

2. High measurement accuracy and good stability, the measurement result is accurate to uin

3. Rapid non-destructive measurement, short measurement time, the fastest measurement results within 10s

4. Can analyze solid and solution; Qualitative, semi-quantitative and quantitative analysis

5. Material identification and classification detection, material and alloy element analysis, element spectrum qualitative analysis

6. Powerful data statistics and processing functions: average value, standard deviation, relative standard deviation, maximum value, minimum value, etc

7. Result output: directly print or one-click export to PDF, Excel file; Reports contain data, images, statistical charts, customer information and more

8. Measurement position preview function; High resolution color CCD sample observation system with standard optical magnification of 30 times

9. Provide global service and technical support

1.6 Technical parameters

2. Product configuration list

2.1 SDD Semiconductor detector cooled by electricity: (latest detector)

2.1.1. SDD semiconductor detector cooled by electricity; resolution: 129 ± 5 EV

2.1.2. Amplification circuit module: detect the sample characteristic X-rays; further enlarge the collected information.

2.2 X-ray excitation device:

2.2.1. Max. filament current output: 1mA;

2.2.2. Semi-loss component, 50W, air cooling.

2.3 High-pressure Transmitter:

2.3.1. Maximum voltage output: 50kV;

2.3.2. Minimum 5kv controllable adjustment

2.3.3. Self-contained voltage overload protection