IEC 60745-2-5 Figure 110 IEC Test Equipment Test Probe B With 12mm Diameter

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Certification:Calibration certificate(cost additional)
Model Number:HDD8305
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IEC 60745-2-5 Figure 110 IEC Test Equipment Test Probe B With 12mm Diameter


IEC60745-2-5 clause 19.101.2.4

For checking the accessibility of the cutting edge zone at the front of the saw above the guide plate, the rigid test probe ‘b’ of Figure 110 shall not contact the blade when the saw is set for a 90° cut and any depth of cut and the probe ‘b’ is centred with the blade then advanced in any single plane perpendicular to the blade and parallel to the guide plate, as specified in Figure 111. The test is repeated with probe ‘b’ offset 13 mm to the right of the blade centre and then offset 13 mm to the left of the blade centre.
Compliance is checked by inspection and measurements. IEC Test Equipment


Standard: IEC 60745-2-5 : Particular requirements for circular saws, clause 19.101.2.4 and Figure 110

Application: This probe is applicable to checking the accessibility of the cutting edge zone at the saw above the guide plate.

Test sample: Circular saws IEC Test Equipment

Parameter:

Probe length50mm
Probe diameter12mm
Probe materialStainless steel

Standard figure:

Picture for reference:

China IEC 60745-2-5 Figure 110 IEC Test Equipment Test Probe B With 12mm Diameter supplier

IEC 60745-2-5 Figure 110 IEC Test Equipment Test Probe B With 12mm Diameter

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