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Opto Edu A63.7088 Schottky Field Emission Gun Scanning Electron Microscope SE+CCD 1x~2000000x

Opto Edu A63.7088 Schottky Field Emission Gun Scanning Electron Microscope SE+CCD 1x~2000000x

Brand Name:CNOEC, OPTO-EDU
Certification:CE, Rohs
Model Number:A63.7088
Minimum Order Quantity:1 pc
Delivery Time:5~20 Days
Payment Terms:T/T, West Union, Paypal
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Location: Beijing Beijing China
Address: F-1501 Wanda Plaza, No. 18 Shijingshan Road, Beijing 100043, China
Supplier`s last login times: within 1 hours
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Product Details

Schottky Field Emission Gun Scanning Electron Microscope, SE+CCD, 1x~2000000x

  • 1x~2000000x With Detector SEx2+BSE+CCD, Extention Port For EDS, EBSD, CL
  • Schottky Field Emission Gun Voltage 0.02~30kV, Resolution 1nm@15KV(SE), 1.5nm@1KV(SE)
  • 5 Axes Auto Stage X=125, Y=125, Z=50, R=360°, T=-5°~+70° Specimen Room Ф330xH260mm
  • Vaccum Pumps: 1 Ion +1 Turbo Molecular+ 1 Mechanical, Including Computer, Windows & Software, Control Panel
  • Composite Lens With Electrostatic Lens + Magnetic Lens Worry Free Imaging of Magnetic Samples
A63.7088
Resolution1.0nm@30KV(SE), 1.5nm@1KV(SE)
Magnification1x~2000000x
Electron GunSchottky Field Emission Gun
VoltageAccelerating Voltage 0.02~30KV
Electron Beam1pA~20nA
Vacuum System1 Sputter Ion Pump, 1 Turbo Molecular Pump, 1 Mechanical Pump
DetectorSE in Lens, SE in Sample Room, BSE, CCD
Extend PortExtend Ports On Sample Room For BSE, EDS, EBSD, CL etc.
Specimen Stage5 Axes Auto Stage, Travel Range: X=125mm, Y=125mm, Z=50mm, R=360°, T=-5°~+70°
Max SpecimenSpecimen Room Dia.330mm, Height 260mm
Image SystemReal Still Image Max Resolution 256x256~16k~16k Pixels
Computer & SoftwarePC Work Station Windows System, With Professional Image Analysis Software To Fully Control Whole SEM Microscope Operation, Mouse, Keyboard
Control PanelIncluded
Dimension & WeightMain Body 1900x1100x1800mm, Total Weight 800Kg
Optional Accessories
A50.7091Ion Beam Cleaner
A50.7092Field Emission Gun Lamp

Superior Electron-optics Design

Thermal field emission electron gun, stable beam, high imaging resolution

Full tube acceleration technology ensures high imaging performance of electron beam at low acceleration voltage

Composite lens design of electrostatic lens and magnetic lens, the objective lens has no magnetic leakage, and the imaging of magnetic samples is worry-free

Comprehensive Signal Collection System

Can simultaneously collect signals from two types of secondary electrons, backscattered electrons and transmitted electrons.

The sample morphology and composition contrast are displayed simultaneously to reveal the sample's microscopic morphology and composition information to the greatest extent.


China Opto Edu A63.7088 Schottky Field Emission Gun Scanning Electron Microscope SE+CCD 1x~2000000x supplier

Opto Edu A63.7088 Schottky Field Emission Gun Scanning Electron Microscope SE+CCD 1x~2000000x

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