139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing

Brand Name:HUATEC
Certification:CE ISO GOST
Model Number:H3543HWC-EG
Minimum Order Quantity:1
Place of Origin:China
Packaging Details:export standard carton package
Contact Now

Add to Cart

Verified Supplier
Location: Beijing Beijing
Address: 7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096
Supplier`s last login times: within 48 hours
Product Details Company Profile
Product Details

139 Micron Amorphous Silicon A-Si For Various Fields Such As DR And Non-Destructive Testing


H3543HWC-EG is a lightweight wireless detector based on amorphous silicon(a-Si), which is suitable for various fields such as DR and Non-destructive testing.


Sensor
Receptor Type a-Si

Scintillator Gos / CsI:TI

Active Area 350 x 430 mm

Resolution 2560 x 3072

Pixel Pitch 139 μm


Power Supply & Battery

Adapter In AC 100-240V,50-60Hz

Adapter Out DC 24V,2.7A

Power Dissipation <20 W

Standby Time 6.5 h

Recharge Time 4.5 h


Image Quality
Limiting Resolution 5 LP/mm

Energy Range 40-160 KV

Dynamic Range ≥76 dB

Sensitivity ≥0.36 LSB/nGy

Ghos <1% 1st frame

DQE 38% @(1 LP/mm)

21% @(2 LP/mm)

MTF 75% @(1 LP/mm)

48% @(2 LP/mm)

28% @(3 LP/mm)


China 139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing supplier

139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing

Inquiry Cart 0