Impact Device / Probe Portable Hardness Tester Leeb Hardness Tester
Brand Name:SADT
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Model Number:-
Minimum Order Quantity:1 pcs
Delivery Time:5-8 work days
Payment Terms:Western Union, T/T, paypal
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Beijing Beijing China
Address:
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
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Product Details
Impact device/Probe for IMPACT DEVICE Leeb hardness tester
Various impact devices includes analog impact device, digital
impact device, wireless impact device, universal impact device and
unique reading probe, they are designed for Leeb hardness testers,
which make the testers suitable for testing the hardness of all
metals. They are widely used in the industry of power, petro
chemistry, air space, vehicle, machine and so on.
IMPACT DEVICE
Analog impact device with cable
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Impact Device E
Impact Device G
Universal impact device with cable
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Impact Device E
Impact Device G
Digital impact device with cable
Impact Device D
Wireless impact device
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Reading impact device
RP Reading Probe
Specification
| Impact Device (Probe) | Description | ||
| D | Universal standard unit for majority of hardness testing assignments. | ||
| DC | Extremely short impact device, other specs identical with type D. | ||
| Application: | Highly confined spaces. | ||
| Holes and cylinders. | |||
| Internal measurements on assembled machines | |||
| D+15 | Slim front section | ||
| Application: | Grooves and recessed surfaces | ||
| DL | Extremely slim front section. | ||
| Application: | Extremely confined spaces | ||
| Base of grooves | |||
| C | Reduced impact energy ( compared with type D) | ||
| Application: | Surface hardened components, coatings | ||
| Minimum layer thickness: 0.2mm | |||
| Thin walled or impact sensitive components (small measuring indentation) | |||
| E | Synthetic diamond test tip (approx.5000 HV) | ||
| Application: | Extremely high hardness measurement such as high carbon steel up to 1200 HV | ||
| G | Enlarged test tip, increased impact energy(approx. 9 times that of type D) | ||
| Application: | Brinell hardness range only | ||
| Heavy cast and forged parts with lower demands on surface finish | |||
Impact Device / Probe Portable Hardness Tester Leeb Hardness Tester
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