1 - 10 Results for tone probe tester from 611 Products
Delrin / Stainless Steel Material Hook Probe Tester Unjointed New Conditon IEC60601
IEC60601 Test Probe Kit Includes Test Hook Standard Test Finger Unjointed Finger Probe etc. The PG-60601 contains the device listed in the core of the UL / IEC / EN 60601 requirements. It includes the following probes: 1. Jointed Finger Probe Diameter of finger: 12mm Length of finger: 80mm Diameter of baffle: 50mm Length of baffle: 100mm Thruster (optional) 10N Material: Insulating material (baffle and handle), stainless steel(finger) 2. 50mm...
Pego Electronics (Yi Chun) Company Limited
Verified Supplier
No. 317, Yichun South Road ( Happiness Park), Yuanzhou District, Yichun, Jiangxi, 336000, China
Aloka UST-981 Ultrasound Probe Tester ABS Material Convex Array Type 5MHZ Frequency
Compatible Aloka UST-981-5.0 Convex array Ultrasound Transducer Probe 5MHZ for SSD-500 / 620 Brand: Aloka Model No.: UST-981-5.0 Application: Transvaginal Frequency: 5 MHz Advantage: No allergic reaction Condition: Excellent Compatible Systems : SSD-500/ SSD-620/ SSD-625/SSD-650/SSD-1100/Prosound 2 Package Size: 45.0 * 28.0 * 8.0 ( cm ) Gross Weight/Package: 3.0 ( kg ) Packaging & Delivery Shipment:DHL//UPS/TNT/EMS/By sea Delivery date:Within 7...
Superfine Luminaire Hook Probe Tester 1 Mm Thickness QC Department Tool
Test Hook According to IEC60065 for Protection Test Against Electric Shock 1.Introduction The test hook is designed according to IEC60065:2005 and GB8898-2009. It is mainly applied to do the protection test against electric shock, it is a necessary tool for QC department. 2.Specification ●Length: 180mm ● Width: 8mm ● Length of hook: 5mm ● Thickness: 1mm...
Pego Electronics (Yi Chun) Company Limited
Verified Supplier
No. 317, Yichun South Road ( Happiness Park), Yuanzhou District, Yichun, Jiangxi, 336000, China
YANTAK FCC AVo Meter YD208 Electrical Probe Tester
YANTEK YD208 Powerscan PS100 Electrical System Diagnostic Tool Power Probe Circuit Tester Tool CE/ROHS/FCC PowerScan PS100 Electrical System Diagnostic Tool Automotive Circuit Tester Function: 1. Voltage Testing Function 2. Frequency testing function 3. Resistance testing function 4. Diode testing function 5. Switch function to choose if probe power supply or grounding function. Features: 1. Performs every type of service including power...
Shenzhen Yantak Electronic Technology Co., Ltd
Verified Supplier
fanshenlu baoanqu shenzhen,China
HARTIP2500 Metal Hardness Tester / Leeb Hardness Tester RP Reading Probe
Portable Hardness Tester HARTIP2500 + RP Reading Probe RP reading probe is an impact device for Leeb hardness tester, which not only can work with SADT series hardness tester as external probe with cable, but also can work independently as a single tester. There is a Li-ion battery inside the probe, which can be charged via USB supplier. All parameters of the tester can be set from main tester. The main setup of material and scale from factory...
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Verified Supplier
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
HARTIP2500 RP Reading Probe HL Portable Hardness Tester
Portable Hardness Tester HARTIP2500 + RP Reading Probe RP reading probe is an impact device for Leeb hardness tester, which not only can work with SADT series hardness tester as external probe with cable, but also can work independently as a single tester. There is a Li-ion battery inside the probe, which can be charged via USB supplier. All parameters of the tester can be set from main tester. The main setup of material and scale from factory...
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Verified Supplier
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Color Diplay 7 Probes Leeb Portable Hardness Tester
Portable Hardness Tester HARTIP2500 + RP Reading Probe RP reading probe is an impact device for Leeb hardness tester, which not only can work with SADT series hardness tester as external probe with cable, but also can work independently as a single tester. There is a Li-ion battery inside the probe, which can be charged via USB supplier. All parameters of the tester can be set from main tester. The main setup of material and scale from factory...
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Verified Supplier
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Cable Probe Wireless Probe Portable Hardness Tester Digital
Portable Hardness Tester HARTIP 2500+ With Digital Probe D and wireless probe D HARTIP 2500 is an innovation of traditional Leeb hardness tester, which based on our patent technology inside probe. All probes worked with HARTIP 2500 are modularized digital probe, which gives more accurate hardness value. Besides, HARTIP2500 can also work with our wireless probe and new RP reading probe as optional. Advantages Equipped with digital probes only ...
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Verified Supplier
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
HARTIP25000+ Portable Hardness Tester Cable Probe Or Wireless Probe
Portable Hardness Tester HARTIP 2500+ With Digital Probe D and wireless probe D HARTIP 2500 is an innovation of traditional Leeb hardness tester, which based on our patent technology inside probe. All probes worked with HARTIP 2500 are modularized digital probe, which gives more accurate hardness value. Besides, HARTIP2500 can also work with our wireless probe and new RP reading probe as optional. Advantages Equipped with digital probes only ...
SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Verified Supplier
Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Multifunctional Electric Probe Tester A HDD8301 IEC 60745 2 5 High Accuracy
Test Probe a HDD8301 Standard: IEC 60745-2-5 : Particular requirements for circular saws, clause 19.101.2 and Figure 105 Application: This probe is applicable to verify the upper guard protection against to touch the blade. Test sample: Circular saws Feature: Apertures in the guarding system above the guide plate, unless otherwise specified below, shall be designed such that the test probe ‘a’ of figure 105, when inserted at any angle and to the...
shanghai kerang technology co ltd
Zone C, 2 / F, building 3, 69 Huafang Road, Qingpu District, Shanghai, China
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